Symmetric transparent BIST for RAMs
Sybille Hellebrand, H.-J. Wunderlich, Vyacheslav N. Yarmolik · 1999
The paper introduces the new concept of symmetric transparent BIST for RAMs. This concept allows one to skip the signature prediction phase of conventional transparent BIST approaches and therefore yields a significant reduction of test time. The hardware cost and the fault coverage of the new scheme remain comparable to that of a traditional transparent BIST scheme. In many cases, experimental studies even show a higher fault coverage obtained in shorter test time.