Framework for Quantitative S/W Development Performance Measurement and Analysis in Semiconductor Industry
Ki‐Won Song, Soo-Hwan Lee, Young-Gyun Jang, Il-Seok Suh, Jin‐Soo Kim · 2008
This paper presents a framework for quantitative software development performance measurement and analysis based on characteristics of software in System on Chip (SoC) industry, one of the semiconductor businesses. In this paper, we propose a measurement model based on not only theoretical model (Performance Pyramid) but also characteristics of SoC embedded software. The paper also presents surroundings of the model - a measurement process, an infrastructure and its constituent units, and Key Performance Indicators (KPIs), which are the basis of the quantitative software development performance measurement. Quantitative software development performance measurement is not just collecting indicators but analyzing quality, cost, and delivery (QCD) of collected indicators. This makes possible both external effectiveness and internal efficiency. Externally, it is possible for programmers to develop software meeting customers' needs. Internally, more efficient software development can be possible through the visible productivity increase.