The effect of program and model structure on mc/dc test adequacy coverage
Ajitha Rajan, Michael W. Whalen, Mats P. E. Heimdahl · 2008
In avionics and other critical systems domains, adequacy of test suites is currently measured using the MC/DC metric on source code (or on a model in model-based development). We believe that the rigor of the MC/DC metric is highly sensitive to the structure of the implementation and can therefore be misleading as a test adequacy criterion. We investigate this hypothesis by empirically studying the effect of program structure on MC/DC coverage.