Mixed-signal BIST using correlation and reconfigurable hardware
José Machado da Silva, João Duarte, J.S. Matos · Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537) · 2002
Reducing the area overhead required by BIST structures can be achieved by reconfiguring existing hardware to perform test related control and processing functions. This work shows how the resources required for these operations can be implemented in-circuit, taking advantage of programmable logic available in the system. Structural and functional tests are performed using correlation to obtain i/sub DD/ and /spl nu//sub OUT/ cross-correlation signatures, and to measure gain, phase, and total harmonic distortion.