A Multi-dimensional Pattern Run-Length Method for Test Data Compression
Lung‐Jen Lee, Wang‐Dauh Tseng, Rung‐Bin Lin, Chen-Lun Lee · 2009
This paper presents a run-length-based compression method considering dimensions of pattern information. Information such as pattern length and number of pattern runs is encoded to denote the compression status. The decoder is simple and requires very low hardware overhead. Significant improvements are experimentally demonstrated on larger ISCAS'89 benchmarks.