Testing expert systems using conventional techniques
Wei‐Tek Tsai, S. Kirani, Imran Ahmed Zualkernan · 2003
The authors describe a life-cycle approach for testing expert systems. They comment on the difficulties associated with testing of an expert system. Pragmatic testing methods of conventional software engineering are proposed as a solution to these problems. The application of these techniques is illustrated through an extended example for the expert system, MAPS, which diagnoses faults in a bipolar transistor induced to process defects in a VLSI manufacturing environment.>