Using NIST crystal data within Siemens software for four-circle and SMART CCD diffractometers
S.K. Byram, Charles F. Campana, James F. Fait, R. A. Sparks · Journal of Research of the National Institute of Standards and Technology · 1996
NIST Crystal Data developed at The National Institute for Standards and Technology has been incorporated with Siemens single crystal software for data collection on four-circle and two-dimensional CCD diffractometers. Why this database is useful in the process of single crystal structure determination, and how the database is searched, are described. Ideas for future access to this and other databases are presented.