FUNTEST: a functional automatic test pattern generator for combinational circuits
Sami A. Al-Arian, Martin Nordenso · 2003
An automatic test pattern generator (ATPG) for combinational circuits based on a functional description has been developed. The algorithm generates tests on the basis of a set of Boolean equations or higher functional representations where little or no knowledge of the physical structure is required. A functional fault coverage is defined and related to structural fault coverage.>