Multi-signal flow graphs: a novel approach for system testability analysis and fault diagnosis
S. Deb, Krishna Rao Pattipati, V. Raghavan, M. Shakeri, Rupesh Shrestha · IEEE Aerospace and Electronic Systems Magazine · 1995
In this paper, we present a comprehensive methodology for a formal, but intuitive, cause-effect dependency modeling using multi-signal directed graphs that correspond closely to hierarchical system schematics and develop diagnostic strategies to isolate faults in the shortest possible time without making the unrealistic single fault assumption. A key feature of our methodology is that our models lend naturally to real-world necessities, such as system integration and hierarchical troubleshooting.>