Effective built-in self test for Booth multipliers
Dimitris Gizopoulos, Antonis Paschalis, Y. Zorian · IEEE Design & Test of Computers · 1998
Booth multipliers, widely used as embedded cores in general-purpose data path structures and specialized digital signal processors, pose serious testability problems. This generic BIST scheme does not require DFT modifications in the multiplier structure, guarantees fault coverage higher than 99%, and can be adopted by any module generator.