Analog module metrology using MNABST-1 P1149.4 test chip
Yue-Tsang Chen, Chauchin Su · 2002
This paper presents a metrology to extend P1149.4 from external component testing to internal module measurement. A series of experiment has been conducted to verify that the metrology is able to tolerate parasitic effects and test signal variation. As compare to the direct measurement, the metrology achieves an improvement of 14 dB in measurement SNR. Furthermore, it also extends the frequency range by one order.