Custom testing procedure Hall IC testing system design
Dawei Xu, Weigong Zhang, Kunbao Ma · 2009
For the need for device testing and classification requirements of Hall IC manufacturers, which designed a set of automated testing software and hardware systems, and proposed a kind of method based on testing templates and classified conditions, and describe the composition of the testing template and their analytical method. The testing procedure is as follows, the mechanical arm fetch the device and put it into the magnetic field, then test the device as the testing template and classify it by the classified condition. Experimental results show that the system is working correctly, and resolution of the test result can achieve 1mV, 1uA, 1 Gauss.