Study on fast fault diagnosis of capacitor with tolerance based on BIST
Min Zhu, Chao Sun, Chunling Yang · 2009
This paper presents a novel and practical method for the fault diagnosis of capacitor with tolerance based on the technique of (Built-In Self-Test). An easily achievable square-wave is used as the test pattern. The method adopts the detecting circuit for the interpretation of test response and after filtering, uses the direct current signal as the output of test response. We obtain the results of the test from the output of a comparator, which is a part of the analog circuits. The proposed method has the advantages of simple test vector, rapid diagnosis and high diagnosis accuracy.