On applying circular self-test path (CSTP) technique to circuits
Charles A. Njinda, R. Srinivasan, M.A. Breuer · 2002
It is pointed out that the use of a circular self-test path is an attractive built-in self-test technique due to the advantages of a single test session and ease of control. The authors present a procedure for selecting registers for a circular path so that each combinational block of the circuit is tested functionally exhaustively. High-level structural details like identity modes (I-modes) of the circuit are used to reduce the test time and area overhead at the expense of slightly more complex control. A mixed mode test strategy is suggested to improve the pattern coverage for the circuit. Analytical expressions are derived for estimating test time.>