Comments on "Test efficiency analysis of random self-test of sequential circuits"
Slawomir Pilarski · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1995
For the original article see ibid., vol. 10, no. 3, p. 390-98 (1991). In the aforementioned paper by S. Sastry and A. Majumdar the testing effectiveness of random pattern techniques is studied and the authors claim to give complete analytical solutions to the problem of estimating such an effectiveness. The commenters point out that the analysis is based on an oversimplified circuit model, and, therefore, the conclusions are invalid. They comment on the analysis and explain its weakness, especially with respect to the built-in self-test (BIST) technique referred to as circular self-test path (CSTP).>