A P1500 compliant BIST-based approach to embedded RAM diagnosis
Davide Appello, Fulvio Corno, Mario B. Giovinetto, Maurizio Rebaudengo, Matteo Sonza Reorda · 2001
This paper deals with the diagnosis of faulty embedded RAMs and outlines the solution which is currently under evaluation within STMicroelectronics. The proposed solution exploits a BIST module implementing a March algorithm, defines a wrapper allowing its interface with a TAP controller, and describes a diagnostic procedure running in the external ATE software environment. The approach allows one to test multiple modules in the same chip through a single TAP interface and is compliant with the proposed P1500 standard for Embedded Core Test. Some preliminary experimental results gathered using a sample circuit are reported, showing the effectiveness of the proposed solution in terms of area and time requirements.