Octal-Site EVM Tests for WLAN Transceivers on "Very" Low-Cost ATE Platforms
G. Srinivasan, Hui-Chuan Chao, Friedrich Taenzler · 2008
Present day needs of RF IC manufactures for EVM tests in production testing from engineering and customer perspectives strongly demands massive parallel testing. This paper presents an industry development and deployment approach of octal-site, OFDM based broadband EVM tests on low-cost ATE platforms. Results obtained from an octal-site EVM solution for a WLAN transceiver is presented to validate the approach. The effects of repeatability and isolation of these tests in multi-site configuration are discussed. Also, a study of test time and test cost is presented to justify deployment of these tests in production.