A diagnosis algorithm for extreme space compaction
Stefan Holst, Hans-Joachim Wunderlich · 2009
Abstract — During volume testing, test application time, test data volume and high performance automatic test equipment (ATE) are the major cost factors. Embedded testing including builtin self-test (BIST) and multi-site testing are quite effective cost reduction techniques which may make diagnosis more complex. This paper presents a test response compaction scheme and a corresponding diagnosis algorithm which are especially suited for BIST and multi-site testing. The experimental results on industrial designs show, that test time and response data volume reduces significantly and the diagnostic resolution even improves with this scheme. A comparison with X-Compact indicates, that simple parity information provides higher diagnostic resolution per response data bit than more complex signatures. Throughput requirements and test application time are reduced, if each die is equipped with test data decompression and test response compaction logic (figure 2) [1].