DCIATP-an iterative analog circuit test generation program for generating DC single pattern tests
M.J. Marlett, Jacob A. Abraham · 2003
An algorithm is proposed for automatic test input generation for nonlinear analog circuits and digital circuits with analog behavior under fault. The algorithm uses high-level reasoning with simple iteration to find inputs which will detect resistive shorts and opens that cause DC errors. A simple version of the algorithm, for the time-domain case, has been implemented. Current work includes incorporating the heuristics into the path-generating algorithm, creating tests for larger circuits, extending the fault model to a parameter change in branches other than resistors (e.g. a beta change in a transistor), creating sensitivity metrics for the frequency domain and developing a transient error solution.>