250-MHz advanced test systems
A. J. Gruodis, D. E. Hoffman · IEEE Design & Test of Computers · 1988
New generations of electronic chips bring with them the promise of more capacity, storage, and speed. They also bring new challenges to design, test and manufacturing. A look at a series of advanced test systems, how they were designed and why, sheds new light on this practical side of advanced technology. These test systems are the ATS series from IBM.>