On applying non-classical defect models to automated diagnosis
J. Saxena, Kenneth M. Butler, H. Balachandran, D.B. Lavo, Brian Chess, Tracy Larrabee, F. Joel Ferguson · 2002
Automated fault diagnosis based on the stuck-at fault model is not always effective. This paper presents practical experiences in applying a bridging fault based diagnosis technique to a TI ASIC design. Results are presented for units into which known bridging defects have been introduced via a focused ion beam (FIB) machine.