On-chip I/sub DDQ/ testing in the AE11 fail-stop controller
Eberhard Bohl, T. Lindenkreuz, M. Meerwein · IEEE Design & Test of Computers · 1998
Targeted for safety-critical applications, this microcontroller replaces the classic two-controller safety structure with a single controller containing various online fault detection measures. To minimize chip area without reducing safety, the developers incorporated a combination of concurrent checking, BIST, and I/sub DDQ/ testing-and considerably extended the standard cell-based design flow.