Automatic analog test signal generation using multifrequency analysis
S. Huynh, Seongwon Kim, Mani Soma, Jinyan Zhang · IEEE Transactions on Circuits and Systems II Analog and Digital Signal Processing · 1999
A new multifrequency test generation technique for detecting catastrophic and parametric failures in this class of circuits is presented. Testability transfer factors for circuit elements are introduced and we use them to construct an efficient dynamic test set. Fault detectability and fault coverage are also defined. We also describe the signature analysis methodology used to evaluate the generated test set. Circuits from the suite of analog and mixed-signal benchmark circuits are used to validate our approach. The approach presented may be used to construct input signals for the selection of an external stimulus applied through an arbitrary waveform generator.