A novel built-in current sensor for I/sub DDQ/ testing of deep submicron CMOS ICs
S.P. Athan, D.L. Landis, Sami A. Al-Arian · 2002
Today's built-in current sensor (BICS) techniques provide I/sub DDQ/ current sensitivity which is adequate for testing and diagnosing near-micron CMOS ICs. However, faulty and fault-free I/sub DDQ/ can become indiscernible at deep submicron levels. This paper describes a novel BICS methodology which improves fault detectability and diagnosability in ULSI CMOS ICs.