On selection of state variables for delay test of identical functional units
Aditi Kajala, Sinsinwar Gayaprasad, Rahul Raj Choudhary, Jaynarayan Tudu, Virendra Pal Singh · 2010
Multiple copies of the same functional units are common in today's design. It allows us to reduce golden reference storage by performing comparison of output response of the identical circuits when identical input sequence is applied to them. We present output response comparison scheme for identical sequential circuits for delay test using static transition probability. This allows us to make selection independent of the input sequence.