Test length reduction for accumulator-based self-test
F. Mayer, Albrecht P. Stroele · 2002
Many circuits contain adders and subtracters that can be configured as accumulators. When the circuits are tested, these accumulators may operate as test pattern generators. However, often long pattern sequences are required to achieve high fault coverage. This paper shows that an optimal selection of the initial state and the input value of the accumulators can significantly reduce test lengths. An efficient method to perform this optimization is presented.