Unifying methodologies for high fault coverage concurrent and off-line test of digital filters
I. Bayraktaroglu, Alex Orailoğlu · 2002
A low-cost on-line test scheme for digital filters that additionally provides an off-line BIST solution is proposed. The scheme utilizes an invariant of the digital filter in order to detect on-line possible circuit malfunctions. The on-line checking hardware is shared with off-line BIST. The analysis performed indicates that exact 100% fault secureness is attained when the digital filter is designed according to design criteria that we identify in the paper. Furthermore, fault simulations show near 100% fault coverage for off-line BIST.