An automated unique tagging system using CMOS process variation
Brandon L. Dell, Jonathan F. Bolus, Travis N. Blalock · 2007
An Automated Unique Tagging System (AUTS) is presented, intended for RFID applications, that generates identification numbers based on random process variations, circumventing the need for non-volatile memories such as EEPROM or Flash. A sense amplifier is used to measure the mismatch in threshold voltage between two identical NMOS devices and generate a 1-bit random output. The AUTS has been fabricated in the TSMC 0.25μm CMOS process and tested.