Robust Test Generation for Precise Crosstalk-induced Path Delay Faults
Huawei Li, Peifu Shen, Xiaowei Li · 2006
Crosstalk-induced delay should be tested for high-speed circuits. We propose a robust test generation technique based on a single precise crosstalk-induced path delay fault model, S-PCPDF model. The path sensitization criterion of robust test generation for a target S-PCPDF is defined separately for sensitizing the path under test and sensitizing the sub-path to propagate aggressor transitions. Experimental results showed that the proposed technique can be applied to circuits of reasonable sizes within an acceptable time. The average test efficiency is high.