Deconfigurable microprocessor architectures for silicon debug acceleration
Nikos Foutris, Dimitris Gizopoulos, Xavier Vera, Antonio M. González · 2013
The share of silicon debug in the overall microprocessor chips development cycle is rapidly expanding due to the ever growing design complexity and the limited efficiency of pre-silicon validation methods. Massive application of short random test programs on the prototype microprocessor chips is one of the most effective parts of silicon debug. However, a major bottleneck and source of "noise" in this phase is that large numbers of random test programs fail due to the same or similar design bugs. This redundant behavior adds long delays in the debug flow since each failing random program must be separately examined, although it does not usually bring new debug information. The development of effective techniques that detect dominant modes of failure among random programs and triage them into common categories eliminate redundant debug sessions and significantly boost silicon debug.