Architecture of test support ICs for mixed-signal testing
J.S. Matos, João Canas Ferreira, A. Carneiro Leao, José Machado da Silva · 2002
Discusses the need of a test infrastructure to support the testing of mixed-signal electronic systems, and discusses a general architecture for test support ICs that can be used to build it. An implementation of a subset of this architecture is described together with its application in a practical example.>