Improving a 3 Data-Source Diagnostic Method
Yassine Hariri, Claude Thibeault · 2006
In this paper, we present improvements to a diagnosis method for bridging faults combining three different data sources. The first data source is a set of IDDQmeasurements used to identify the most probable fault type. The second source is a list of parasitic capacitances extracted from layout and used to create a list of realistic potential bridging fault sites. The third source is logical faults detectable at the primary outputs (including scan flip flops), used to limit the number of suspected gates. Combining these data significantly reduces the number of potential fault sites to consider in the diagnosis process. The modifications proposed in this paper allow the technique to be even more suitable for very large devices. Results obtained with different circuits are provided