A new built-in self-test method based on prestored testing
Geetani Edirisooriya, S. Edirisooriya, John P. Robinson · 2002
Built-in-self-test (BIST) schemes provide on-chip circuitry to generate test vectors and to analyze output responses so that testing can be performed without using expensive external testers. The authors present a unified approach to test pattern generation and output compaction. ISCAS benchmark circuits are used to show the applicability of the proposed method.>