Subpixel parameter estimation for elliptical shapes using image sequences
Jack Reed, Seth Hutchinson · 2002
We present a method of ellipse parameter estimation that can be used in performing automated inspection of circular features. In our method, several digital images are taken of each part as it moves past a camera, creating an image sequence. Image enhancement is performed using the image sequence, yielding a high-resolution image. Subpixel edge detection is performed on the high-resolution image, producing a set of data points that is used for ellipse parameter estimation.>