Statistical analysis of apodized array pattern characteristics under spatially correlated error influence
I.P. Anukhin, Владимир Васильевич Лукин, Miao Zhenjiang, Alexander A. Zelensky · 2002
It is shown that the array pattern parameters under the influence of spatially correlated errors and distortions can and should be optimized in a statistical sense. The proposed sum-type apodization functions (step-like functions also belong to this class) are able to provide the available trade-off of disturbed pattern characteristics. In particular, the mean maximal side lobe level (MSLL) can be reduced by 1.2 dB even in comparison with the optimal Dolph-Chebyshev and Kaiser-Bessel patterns if the initial MSLL is equal. Heuristic recommendations concerning the apodization function selection for a priori known error correlation characteristics and variance are presented.