On maximizing the fault coverage for a given test length limit in a synchronous sequential circuit
Irith Pomeranz, Sudhakar M. Reddy · IEEE Transactions on Computers · 2004
When storage requirements or limits on test application time do not allow a complete (compact) test set to be used for a circuit, a partial test set that detects as many faults as possible is required. Motivated by this application, we address the following problem. Given a test sequence T of length L for a synchronous sequential circuit and a length M