Near-optimal sequential testing algorithms for multiple fault isolation
M. Shakeri, Krishna Rao Pattipati, V. Raghavan, S. Deb · 2002
In this paper, we consider the problem of constructing near-optimal test sequencing algorithms for diagnosing multiple faults. The computational complexity of solving the optimal multiple-fault isolation problem is super-exponential, that is, it is much more difficult than the single-fault isolation problem, which in itself is an NP-hard problem. Our approach is to extend the single fault sequential testing algorithms of our previous work (1990, 1991) to a class of sure strategies for diagnosing multiple faults. The proposed static diagnostic strategies are illustrated using several examples. Computational results based on real-world systems indicate that these static strategies can be used on systems with as many as 600 failure sources and 600 tests. Further, using sure strategies, an online test strategy generation program has been implemented to diagnose multiple faults in larger systems with as many as 10,000 failure sources.>