Synthesis for testability: circuits derived from ordered Kronecker functional decision diagrams
Bernd Becker, Rolf Drechsler · 1995
Testability properties of circuits derived from Ordered Kronecker Functional Decision Diagrams (OKFDDs) [2] are studied with respect to the Stuck-At Fault Model (SAFM) and the Cellular Fault Model (CFM). The computation of complete test sets and of all occuring redundanciescan be done easily and efciently and circuits with high testability can be obtained. The full paper [1] including experimental results can be obtained from the authors. 1 OKFDD-Circuits In general, a Combinational Logic Circuit (CLC) is de ned over a xed library and modeled as a directed acyclic graph C =(V; E) with some additional properties. Very often a standard library (STD) consisting of Primary Input (PI) and Output ports (PO), the 2-input, 1-output AND,