Test Vector Generation for Linear Analog Devices
S.-J. Tsai · 2005
A new approach to generate test vectors for linear analog devices is described. It is intended to enhance the detectability of out-ofspecification defects by generating input vectors that maximize the difference of responses from normal and faulty devices. The vector generation task is formulated as a quadratic programming problem, and an innovative algorithm is developed to provide the solution. Simulation results using a bandpass filter as an example are presented.