New Schemes for Self-Testing RAM
Gh. Bodean, Diana Bodean, A. Labunetz · Design, Automation, and Test in Europe · 2005
This paper gives an overview of a new technique, named pseudo-ring testing (PRT). PRT can be applied for testing a wide type of random access memories (RAM): bit-or word-oriented and single- or dual-port RAM. An essential particularity of the proposed methodology is the emulation of a linear automaton over Galois field by memory own components.