INL and DNL estimation based on noise ADC test
Maria da Glória Flores, Marcelo Negreiros, Luigi Carro, Altamiro Susin · 2004
This paper presented the linearity characterization of an analog-to-digital converter. The input signal is noise, which allows low analog area overhead for Built In Self Test (BIST). The linearity errors estimation is proposed based on the spectral analysis of only the output of the converter. This paper presents the underlying theory and practical results supporting the effectiveness of the proposed method.