Input Test Data Volume Reduction for Skewed-Load Tests by Additional Shifting of Scan-In States
Irith Pomeranz · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 2014
Test data compression methods reduce the input test data volume by allowing compressed tests to be stored on a tester. Additional reductions in the input test data volume can be achieved if each stored test is used for producing several different tests. Skewed-load tests create a unique opportunity to expand a stored test into several different skewed-load tests by continuing to shift the scan-in state for one or more additional clock cycles. This opportunity for test data volume reduction beyond test data compression is introduced in this paper. The paper describes a procedure that starts from a given skewed-load test set. The procedure removes tests from the test set and recovers the fault coverage by applying several tests based on every stored test.