Design of a virtual LCR component meter
W.A. Evans, T. Ingersoll · IEE Proceedings - Science Measurement and Technology · 1995
The paper describes an LCR component meter employing both single-frequency and multifrequency testing of the component. The instrument departs from conventional component-meter practice, where a phase-sensitive detector is used to perform frequency convolution, to one based on the fast-Fourier-transform algorithm. Equivalent circuits of the component are computed at each frequency and displayed on a touch-sensitive window-managed display which forms part of a virtual instrument workstation.