A SiGe 10-Gb/s multi-pattern bit error rate tester
R. Malasani, C. Bourde, Germán Gutiérrez · 2003
In this paper we present a monolithic IC that is capable of generating and evaluating multiple pseudo random bit sequences (PRBS) from DC to 10 Gb/s. This IC could be used as a low cost substitute for more expensive bit error rate test (BERT) systems.