Seamless test of digital components in mixed-signal paths
Sule Ozev, I. Bayraktaroglu, Alex Orailoğlu · IEEE Design & Test of Computers · 2004
For today's large, mixed-signal designs, test generation requires propagating signals through digital and analog modules. We offer an innovative seamless approach that defines a digital test methodology for digital modules wherein the test inputs and responses can be propagated through a path containing analog signals.