Modeling edges at subpixel accuracy using the local energy approach
Marsudi Kisworo, Svetha Venkatesh, GEOFF A. W. WEST · IEEE Transactions on Pattern Analysis and Machine Intelligence · 1994
In this paper we describe a new technique for ID and 2D edge feature extraction to subpixel accuracy using edge models and the local energy approach. A candidate edge is modeled as one of a number of parametric edge models, and the fit is refined by a least-squared error fitting technique.>