Investigating the Efficiency of Integrator-Based Capacitor Array Testing Techniques
Sai Raghuram Durbha, Amit Laknaur, Haibo Wang · 2006
This paper presents techniques to model the impact of parametric faults on the performance of programmable capacitor arrays (PCAs). Closed-form equations are derived for estimating ranges of parametric faults that can be detected by integrator-based PCA testing circuits. Methods to improve PCA testing efficiency are discussed and experimental results are reported.