Comments on 'Totally self-checking CMOS circuit design for breaks and stuck-on faults'
E.M.J.G. Bruls, Manoj Sachdev, Ke Th Baker · IEEE Journal of Solid-State Circuits · 1993
The commenters argue that in the above-titled paper by M.S. Cheema and P.K. Lala (ibid., vol.27, no.8, p.1203-6, Aug. 1992) a reference has been wrongly interpreted by the authors, resulting in an incorrect impression of the defect densities. Another problem, concerning the propagation of faults to the final outputs, is also discussed. Furthermore, the commenter points out that the dynamic behavior of the method is not addressed in the original paper and that the design technique presented in the paper requires a high area overhead with which not all possible defects will be detected.>