Improving Boolean Circuit Testing by using Quantum Search
Yao–Hsin Chou, Sy‐Yen Kuo · 2008
Given any classical circuit, a minimum input quantum version of boolean circuit can be constructed with general CCN gates. Any quantum boolean circuit can be easily tested with one test pattern under stuck-at fault model. In this paper, we apply quantum search algorithm to boolean logic testing problem and drastically decrease not only the number of test patterns but also the time and the number of bits we needed to find out the faulty wires.