Microprocessors functional testing techniques
E.A. Talkhan, Adeel Ahmed, A.E. Salama · IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems · 1989
The authors address the functional testing of microprocessors. A method is introduced for obtaining a minimum set of instructions that replaces the whole instruction set during testing procedure. The method is illustrated on the digital signal processor TM32010.>